Data Analysis
XPS (X-ray Photoelectron Spectroscopy)
XPS is a highly sensitive surface analysis technique used to determine elemental composition and chemical/oxidation states.
Analysis Covered
- Survey Scan Interpretation
- High-Resolution Peak Deconvolution
- Background Subtraction
- Binding Energy Shifts
Methodology: Identifying the overall elemental composition of the sample surface, followed by expert peak fitting using advanced software to separate complex peaks and identify specific oxidation states (e.g., separating Fe²⁺ from Fe³⁺).
Pricing & Charges
| Analysis Type | Charge ($) |
|---|---|
| Survey Scan Interpretation | $25/sample |
| High-Resolution Peak Deconvolution | $20/element |
| Background Subtraction | $8/sample |
| Binding Energy Shifts | $15/sample |
Turnaround Time: 2 to 7 Days